Takuji Hosoi

According to our database, Takuji Hosoi authored at least 3 papers between 2020 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Characterization of Electron Traps in Gate Oxide of m-plane SiC MOS Capacitors.

Yutaka Terao, Takuji Hosoi, Takuma Kobayashi, Takayoshi Shimura, Heiji Watanabe

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Investigation of reliability of NO nitrided SiC(1100) MOS devices.

Takato Nakanuma, Asato Suzuki, Yu Iwakata, Takuma Kobayashi, Mitsuru Sometani, Mitsuo Okamoto, Takuji Hosoi, Takayoshi Shimura, Heiji Watanabe

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020

Toward the Super Temporal Resolution Image Sensor with a Germanium Photodiode for Visible Light.

Nguyen Hoai Ngo, Anh Quang Nguyen, Fabian M. Bufler, Yoshinari Kamakura, Hideki Mutoh, Takayoshi Shimura, Takuji Hosoi, Heiji Watanabe, Philippe Matagne, Kazuhiro Shimonomura, Kohsei Takehara, Edoardo Charbon, Takeharu Goji Etoh

Sensors, 2020