Tengteng Zhang

According to our database, Tengteng Zhang authored at least 14 papers between 2013 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

A New GNSS Interference Detection Method Based on Rearranged Wavelet-Hough Transform.

Kewen Sun, Tengteng Zhang

Sensors, 2021

A Novel GNSS Interference Detection Method Based on Smoothed Pseudo-Wigner-Hough Transform.

Kewen Sun, Baoguo Yu, Mireille Elhajj, Washington Yotto Ochieng, Tengteng Zhang, Jianlei Yang

Sensors, 2021

2020

ACESO-DATASET.

Ping Geng, Tengteng Zhang

Dataset, March, 2020

Aceso: PICO-Guided Evidence Summarization on Medical Literature.

Xiang Zhang, Ping Geng, Tengteng Zhang, Qian Lu, Peng Gao, Jing Mei

IEEE J. Biomed. Health Informatics, 2020

Unlocking the Power of Deep PICO Extraction: Step-wise Medical NER Identification.

Tengteng Zhang, Yiqin Yu, Jing Mei, Zefang Tang, Xiang Zhang, Shaochun Li

CoRR, 2020

Object Motion Deblurring in Single Image Under Static Background.

Tengteng Zhang, Sensen Song, Zhenhong Jia, Jie Yang, Nikola K. Kasabov

IEEE Access, 2020

2019

Bi-directional Generation between Attributes and Images.

Huankun Sheng, Wanying Mo, Tengteng Zhang

Proceedings of the CSAI 2019: 2019 3rd International Conference on Computer Science and Artificial Intelligence, 2019

2015

Pattern Generation for Understanding Timing Sensitivity to Power Supply Noise.

Tengteng Zhang, Yukun Gao, D. M. H. Walker

J. Electron. Test., 2015

Pseudo Functional Path Delay Test through Embedded Memories.

Yukun Gao, Tengteng Zhang, Punj Pokharel, Swati Chakraborty, D. M. H. Walker

J. Electron. Test., 2015

Impact of test compression on power supply noise control.

Tengteng Zhang, D. M. H. Walker

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

2014

Improved power supply noise control for pseudo functional test.

Tengteng Zhang, Duncan M. Hank Walker

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Pattern Generation for Post-Silicon Timing Validation Considering Power Supply Noise.

Tengteng Zhang, Yukun Gao, D. M. H. Walker

Proceedings of the IEEE 23rd North Atlantic Test Workshop, 2014

Delay Test of Embedded Memories.

Yukun Gao, Tengteng Zhang, Swati Chakraborty, D. M. H. Walker

Proceedings of the IEEE 23rd North Atlantic Test Workshop, 2014

2013

Power supply noise control in pseudo functional test.

Tengteng Zhang, Duncan M. Hank Walker

Proceedings of the 31st IEEE VLSI Test Symposium, 2013