Thomas Nirmaier

According to our database, Thomas Nirmaier authored at least 10 papers between 2005 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Virtual Prototyping: Closing the digital gap between product requirements and post-Si verification.

Thomas Nirmaier, Manuel Harrant, Marc Huppmann, Wendy You, Georg Pelz

Proceedings of the IEEE International Test Conference, 2022

2021

Human- and Machine-Readable Requirements Formulation for Lab Verification Automation.

Marc Huppmann, Manuel Harrant, Thomas Nirmaier, Andi Buzo, Linus Maurer, Georg Pelz

Proceedings of the 28th IEEE International Conference on Electronics, 2021

2014

Mission profile aware robustness assessment of automotive power devices.

Thomas Nirmaier, Andreas Burger, Manuel Harrant, Alexander Viehl, Oliver Bringmann, Wolfgang Rosenstiel, Georg Pelz

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Emulation-based robustness assessment for automotive smart-power ICs.

Manuel Harrant, Thomas Nirmaier, Jérôme Kirscher, Christoph Grimm, Georg Pelz

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2012

Configurable load emulation using FPGA and power amplifiers for automotive power ICs.

Manuel Harrant, Thomas Nirmaier, Georg Pelz, Fabrizio Dona, Christoph Grimm

Proceedings of the Proceeding of the 2012 Forum on Specification and Design Languages, 2012

Configurable Load Emulation Using FPGA and Power Amplifiers for Automotive Power ICs.

Manuel Harrant, Thomas Nirmaier, Christoph Grimm, Georg Pelz

Proceedings of the Models, Methods, and Tools for Complex Chip Design, 2012

Measuring and improving the robustness of automotive smart power microelectronics.

Thomas Nirmaier, Volker Meyer zu Bexten, Markus Tristl, Manuel Harrant, Matthias Kunze, Monica Rafaila, Julia Lau, Georg Pelz

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2008

Efficient High-Speed Interface Verification and Fault Analysis.

Thomas Nirmaier, Jose Torres Zaguirre, Eric Liau, Wolfgang Spirkl, Armin Rettenberger, Doris Schmitt-Landsiedel

Proceedings of the 2008 IEEE International Test Conference, 2008

2006

Fully automated semiconductor operating condition testing.

Thomas Nirmaier, Wolfgang Spirkl, Eric Liau Chee Hong

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

High-speed CMOS wavefront sensor with resistive-ring networks of winner-take-all circuits.

Thomas Nirmaier, Cristina Alvarez Diez, Josef F. Bille

IEEE J. Solid State Circuits, 2005