Tieqiao Liu

Orcid: 0000-0001-5509-4540

According to our database1, Tieqiao Liu authored at least 14 papers between 2015 and 2026.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2026
CloudCap3D: enhancing 3D in-scene descriptions via point cloud integration and efficient text filtering.
Multim. Syst., August, 2026

An effective test-per-clock test scheme based on dynamically-partitioned reconfigurable scan chains.
Integr., 2026

2025
Dual channel and dual feedback loop self-learning memristive neural network circuit and its application.
Neural Networks, 2025

A novel locally active memristive autapse-coupled Hopfield neural network under electromagnetic radiation.
Integr., 2025

Memristive Neural Network Circuit of Negative Emotion Inhibition With Self-Repair and Memory.
Int. J. Circuit Theory Appl., 2025

2024
Memristor-based circuit design of episodic memory neural network and its application in hurricane category prediction.
Neural Networks, 2024

2020
An Efficient Degraded Deductive Fault Simulator for Small-Delay Defects.
IEEE Access, 2020

2019
Secure and economical multi-cloud storage policy with NSGA-II-C.
Appl. Soft Comput., 2019

2018
An efficient controlled LFSR hybrid BIST scheme.
IEICE Electron. Express, 2018

2017
Reliability evaluation of logic circuits based on transient faults propagation metrics.
IEICE Electron. Express, 2017

Resource allocation policy based on trust in the multi-cloud environment.
Proceedings of the 2017 IEEE International Conference on Systems, Man, and Cybernetics, 2017

2016
The hybrid intelligence swam algorithm for berth-quay cranes and trucks scheduling optimization problem.
Proceedings of the 15th IEEE International Conference on Cognitive Informatics & Cognitive Computing , 2016

2015
An efficient small-delay faults simulator based on critical path tracing.
Int. J. Circuit Theory Appl., 2015

Harzard-Based ATPG for Improving Delay Test Quality.
J. Electron. Test., 2015


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