Zhiqiang You

According to our database, Zhiqiang You authored at least 36 papers between 2004 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

DTTR: Detecting Text with Transformers.

Jing Yang, Zhiqiang You, Zhiwei Zhong, Peng Liu, Langqi Mei, Shenguang Huang

Proceedings of the IEEE International Conference on Acoustics, 2023

2021

Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory.

Peng Liu, Zhiqiang You, Jigang Wu, Michael Elimu, Weizheng Wang, Shuo Cai, Yinhe Han

IEEE Trans. Emerg. Top. Comput., 2021

Integrating Two Logics Into One Crossbar Array for Logic Gate Design.

Lian Yao, Peng Liu, Jigang Wu, Yinhe Han, Yuehang Zhong, Zhiqiang You

IEEE Trans. Circuits Syst. II Express Briefs, 2021

Fault Modeling and Efficient Testing of Memristor-Based Memory.

Peng Liu, Zhiqiang You, Jigang Wu, Bosheng Liu, Yinhe Han, Krishnendu Chakrabarty

IEEE Trans. Circuits Syst. I Regul. Pap., 2021

2020

A high-performance CNN method for offline handwritten Chinese character recognition and visualization.

Pavlo Melnyk, Zhiqiang You, Keqin Li

Soft Comput., 2020

2019

Efficient data packet transmission algorithm for IPV6 mobile vehicle network based on fast switching model with time difference.

Wei Liang, Jing Long, Xia Lei, Zhiqiang You, Haibo Luo, Jiahong Cai, Kuan-Ching Li

Future Gener. Comput. Syst., 2019

A Pseudo-Random Transform Decomposition Method for Improving the Coding Compression Ratio of Test Data.

Minghe Zhang, Jishun Kuang, Jing Huang, Zhiqiang You

Proceedings of the 21st IEEE International Conference on High Performance Computing and Communications; 17th IEEE International Conference on Smart City; 5th IEEE International Conference on Data Science and Systems, 2019

2018

A novel memristor-based restricted Boltzmann machine for contrastive divergence.

Yan Chen, Zhiqiang You, Yingjie Zhang, Jishun Kuang, Jing Zhang

IEICE Electron. Express, 2018

Optimistic value model of multidimensional uncertain optimal control with jump.

Liubao Deng, Zhiqiang You, Yuefen Chen

Eur. J. Control, 2018

Defect Analysis and Parallel March Test Algorithm for 3D Hybrid CMOS-Memristor Memory.

Peng Liu, Jigang Wu, Zhiqiang You, Michael Elimu, Weizheng Wang, Shuo Cai

Proceedings of the 27th IEEE Asian Test Symposium, 2018

2016

A parallel-SSHI rectifier for ultra-low-voltage piezoelectric vibration energy harvesting.

Liao Wu, Jishun Kuang, Zhiqiang You, Peng Liu, Shuo Cai

IEICE Electron. Express, 2016

2015

An efficient small-delay faults simulator based on critical path tracing.

Tieqiao Liu, Jishun Kuang, Shuo Cai, Zhiqiang You

Int. J. Circuit Theory Appl., 2015

Logic operation-based DFT method and 1R memristive crossbar March-like test algorithm.

Peng Liu, Zhiqiang You, Jishun Kuang, Zhipeng Hu, Weizheng Wang

IEICE Electron. Express, 2015

A signal degradation reduction method for memristor ratioed logic (MRL) gates.

Bosheng Liu, Ying Wang, Zhiqiang You, Yinhe Han, Xiaowei Li

IEICE Electron. Express, 2015

Improve the compression ratios for code-based test vector compressions by decomposing.

Jishun Kuang, Liang Zhang, Zhiqiang You, Yingbo Zhou

Proceedings of the 20th IEEE European Test Symposium, 2015

2014

An adaptive neural network A/D converter based on CMOS/memristor hybrid design.

Weiwei Wang, Zhiqiang You, Peng Liu, Jishun Kuang

IEICE Electron. Express, 2014

Empirical studies on the network of social groups: the case of Tencent QQ.

Zhiqiang You, Xiao-Pu Han, Linyuan Lü, Chi Ho Yeung

CoRR, 2014

2013

A comprehensive metering scheme for intellectual property protection during both after-sale and evaluation periods of IC design.

Aobo Pan, Yaping Lin, Wenjie Che, Zhiqiang You, Yonghe Liu, Jinguo Li

IEICE Electron. Express, 2013

Comparator and half adder design using complementary resistive switches crossbar.

Bosheng Liu, Zhiqiang You, Xiangrao Li, Jishun Kuang, Zheng Qin

IEICE Electron. Express, 2013

2012

Achieving low capture and shift power in linear decompressor-based test compression environment.

Weizheng Wang, Jishun Kuang, Zhiqiang You

Microelectron. J., 2012

Virtual scan chains reordering using a RAM-based module for high test compression.

Ling Zhang, Jishun Kuang, Zhiqiang You

Microelectron. J., 2012

Thermal Simulation of Traction System for High-Speed Train Based on Heat Accumulation.

Huaiyu Xu, Jihui Xu, Zhiqiang You, Wenqi Peng, Kunlin Zhang, Jinfeng Xu

J. Comput., 2012

A scan disabling-based BAST scheme for test cost and test power reduction.

Zhiqiang You, Weizheng Wang, Peng Liu, Jishun Kuang, Zheng Qin

IEICE Electron. Express, 2012

Switching activity reduction for scan-based BIST using weighted scan input data.

Weizheng Wang, Jishun Kuang, Peng Liu, Xin Peng, Zhiqiang You

IEICE Electron. Express, 2012

2011

Test data compression using interval broadcast scan for embedded cores.

Ling Zhang, Jishun Kuang, Zhiqiang You

Microelectron. J., 2011

A scan disabling-based BAST scheme for test cost reduction.

Zhiqiang You, Weizheng Wang, Zhiping Dou, Peng Liu, Jishun Kuang

IEICE Electron. Express, 2011

Test Data Compression Using Selective Sparse Storage.

Ling Zhang, Jishun Kuang, Zhiqiang You

J. Electron. Test., 2011

2010

A GEO-Related IOT Applications Platform Based on Google Map.

Dayu Shi, Huaiyu Xu, Ruidan Su, Zhiqiang You

Proceedings of the IEEE 7th International Conference on e-Business Engineering, 2010

Test Data Compression Using Four-Coded and Sparse Storage for Testing Embedded Core.

Ling Zhang, Jishun Kuang, Zhiqiang You

Proceedings of the Algorithms and Architectures for Parallel Processing, 2010

Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power.

Zhiqiang You, Jiedi Huang, Michiko Inoue, Jishun Kuang, Hideo Fujiwara

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2008

Test Response Data Volume and Wire Length Reductions for Extended Compatibilities Scan Tree Construction.

Yong-sheng Cheng, Zhiqiang You, Jishun Kuang

Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008

A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself.

Jishun Kuang, Ouyang Xiong, Zhiqiang You

Proceedings of the 17th IEEE Asian Test Symposium, 2008

DCScan: A Power-Aware Scan Testing Architecture.

Gui Dai, Zhiqiang You, Jishun Kuang, Jiedi Huang

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2006

A Low Power Deterministic Test Using Scan Chain Disable Technique.

Zhiqiang You, Tsuyoshi Iwagaki, Michiko Inoue, Hideo Fujiwara

IEICE Trans. Inf. Syst., 2006

2005

Power-Constrained Test Synthesis and Scheduling Algorithms for Non-Scan BIST-able RTL Data Paths.

Zhiqiang You, Ken-ichi Yamaguchi, Michiko Inoue, Jacob Savir, Hideo Fujiwara

IEICE Trans. Inf. Syst., 2005

2004

Power-Constrained DFT Algorithms for Non-Scan BIST-able RTL Data Paths.

Zhiqiang You, Ken-ichi Yamaguchi, Michiko Inoue, Jacob Savir, Hideo Fujiwara

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004