Tino Heijmen

According to our database, Tino Heijmen authored at least 7 papers between 2005 and 2008.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2008

Soft-Error Vulnerability of Sub-100-nm Flip-Flops.

Tino Heijmen

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

Special Session 3 - Panel: SER in Automotive: what is the impact of the AEC Q100-G spec?

Tino Heijmen

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

2007

Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs.

Tino Heijmen

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

Factors That Impact the Critical Charge of Memory Elements.

Tino Heijmen, Damien Giot, Philippe Roche

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

Soft Error Rates in Deep-Submicron CMOS Technologies.

Tino Heijmen

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

Soft-Error Rate Testing of Deep-Submicron Integrated Circuits.

Tino Heijmen, André Nieuwland

Proceedings of the 11th European Test Symposium, 2006

2005

Analytical Semi-Empirical Model for SER Sensitivity Estimation of Deep-Submicron CMOS Circuits.

Tino Heijmen

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005