Tomasz Brozek

According to our database, Tomasz Brozek authored at least 6 papers between 2002 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Impact of the Inter-Fin Space on Stress Modulation and FinFET Transistor Performance.

Angelo Rossoni, Tomasz Brozek, Sharad Saxena, Rajesh Khamankar, Zsolt Miklós Kovács-Vajna

Proceedings of the International Conference on IC Design and Technology, 2025

2024

Advanced Silicon Technologies: Design Consequences of Scaling Solutions for Devices.

Tomasz Brozek

Proceedings of the 31st International Conference on Mixed Design of Integrated Circuits and System , 2024

2023

Short-Flow Compatible Wafer-Level Reliability Assessment and Monitoring for PCM Embedded Non-Volatile Memory.

Meindert Lunenborg, Tomasz Brozek, Laura Lorenzi, Christoph Dolainsky, Violet Liu, Xiaoyi Feng

Proceedings of the IEEE International Reliability Physics Symposium, 2023

In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk.

Tomasz Brozek, Alberto A. P. Cattaneo, Larg Weiland, Michele Quarantelli, Alberto Coccoli, Sharad Saxena, Christopher Hess, Andrzej J. Strojwas

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2005

Editorial.

Tomasz Brozek

Microelectron. Reliab., 2005

2002

Series resistance degradation due to NBTI in PMOSFET.

Mahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li

Microelectron. Reliab., 2002