Tuami Lasri

According to our database, Tuami Lasri authored at least 16 papers between 2006 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2016

Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform.

Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Tuami Lasri

IEEE Trans. Instrum. Meas., 2016

2015

Forward V-band vector network analyzer based on a modified six-port technique.

Kamel Haddadi, Tuami Lasri

Proceedings of the IEEE Topical Conference on Wireless Sensors and Sensor Networks, 2015

Measurement accuracy and repeatability in near-field scanning microwave microscopy.

Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Gilles Dambrine, Tuami Lasri

Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015

On-wafer probe station for microwave metrology at the nanoscale.

Abdelhatif El Fellahi, Kamel Haddadi, Jaouad Marzouk, Steve Arscott, Christophe Boyaval, Tuami Lasri, Gilles Dambrine

Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015

2014

Geometrical Optics-Based Model for Dielectric Constant and Loss Tangent Free-Space Measurement.

Kamel Haddadi, Tuami Lasri

IEEE Trans. Instrum. Meas., 2014

Interferometric Technique for Scanning Near-Field Microwave Microscopy Applications.

Hind Bakli, Kamel Haddadi, Tuami Lasri

IEEE Trans. Instrum. Meas., 2014

Six-port technology for millimeter-wave radar and imaging applications.

Kamel Haddadi, Tuami Lasri

Proceedings of the IEEE Topical Conference on Wireless Sensors and Sensor Networks, 2014

1-20 Ghz kΩ-range BiCMOS 55 nm reflectometer.

Pietro M. Ferreira, Cora Donche, Kamel Haddadi, Tuami Lasri, Gilles Dambrine, Christophe Gaquière, Thomas Quemerais, Daniel Gloria

Proceedings of the IEEE 12th International New Circuits and Systems Conference, 2014

2013

Scanning Microwave Near-Field Microscope Based on the Multiport Technology.

Kamel Haddadi, Tuami Lasri

IEEE Trans. Instrum. Meas., 2013

2012

Investigation of optical and chemical bond properties of hydrogenated amorphous silicon nitride for optoelectronics applications.

Etienne Herth, H. Desré, Emmanuelle Algré, Christiane Legrand, Tuami Lasri

Microelectron. Reliab., 2012

2011

Performance of a Compact Dual Six-Port Millimeter-Wave Network Analyzer.

Kamel Haddadi, M. M. Wang, David Glay, Tuami Lasri

IEEE Trans. Instrum. Meas., 2011

2010

Optimization of SiN_X: H films deposited by PECVD for reliability of electronic, microsystems and optical applications.

Etienne Herth, Bernard Legrand, Lionel Buchaillot, Nathalie Rolland, Tuami Lasri

Microelectron. Reliab., 2010

2008

Detection and Characterization of Buried Macroscopic Cracks Inside Dielectric Materials by Microwave Techniques and Artificial Neural Networks.

M. Maazi, O. Benzaim, David Glay, Tuami Lasri

IEEE Trans. Instrum. Meas., 2008

Scanning Near-Field Millimeter-Wave Microscope: Application to a Vector-Coding Technique.

O. Benzaim, Kamel Haddadi, M. M. Wang, M. Maazi, David Glay, Tuami Lasri

IEEE Trans. Instrum. Meas., 2008

2006

Homodyne dual six-port network analyzer and associated calibration technique for millimeter wave measurements.

Kamel Haddadi, David Glay, Tuami Lasri

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

Wide-band 0.9 GHz to 4 GHz Four-Port Receiver.

Kamel Haddadi, Hassan El Aabbaoui, Christophe Loyez, David Glay, Nathalie Rolland, Tuami Lasri

Proceedings of the 13th IEEE International Conference on Electronics, 2006