Varun Thukral

According to our database, Varun Thukral authored at least 2 papers between 2024 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Reliable Board-Level Degradation Prediction with Monotonic Segmented Regression under Noisy Measurement.

Yuxuan Yin, Rebecca Chen, Varun Thukral, Chen He, Peng Li

Proceedings of the 43rd IEEE VLSI Test Symposium, 2025

2024

AI-Enabled Board Level Vibration Testing: Unveiling The Physics of Degradation.

Varun Thukral, Chen He, Rebecca Chen, Letian Zhang, Romuald Roucou, Michiel van Soestbergen, Jeroen J. M. Zaal, Rene Rongen, Willem D. van Driel, G. Q. Zhang

Proceedings of the IEEE International Test Conference, 2024