Wanli Jiang

According to our database, Wanli Jiang authored at least 15 papers between 1998 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

NVAutoNet: Fast and Accurate 360° 3D Visual Perception For Self Driving.

Trung Pham, Mehran Maghoumi, Wanli Jiang, Bala Siva Sashank Jujjavarapu, Mehdi Sajjadi, Xin Liu, Hsuan-Chu Lin, Bor-Jeng Chen, Giang Truong, Chao Fang, Junghyun Kwon, Minwoo Park

Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision, 2024

2022

Confidence Propagation Cluster: Unleash Full Potential of Object Detectors.

Yichun Shen, Wanli Jiang, Zhen Xu, Rundong Li, Junghyun Kwon

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2022

2021

Confidence Propagation Cluster: Unleash Full Potential of Object Detectors.

Yichun Shen, Wanli Jiang, Zhen Xu, Rundong Li, Junghyun Kwon, Siyi Li

CoRR, 2021

2020

A real-time matching algorithm using sparse matrix.

Aomei Li, Wanli Jiang, Po Ma, Jiahui Guo, Weihua Yuan, Dehui Dai

Int. J. Grid Util. Comput., 2020

2017

An Online Approach for Gesture Recognition Toward Real-World Applications.

Zhaoxuan Fan, Tianwei Lin, Xu Zhao, Wanli Jiang, Tao Xu, Ming Yang

Proceedings of the Image and Graphics - 9th International Conference, 2017

2016

Silicon cavity resonator based on locally resonant phononic crystal.

Wanli Jiang, Dehui Xu, Bin Xiong, Yuelin Wang, Duan Feng

Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016

2003

Performance Comparison of VLV, ULV, and ECR Tests.

Wanli Jiang, Eric Peterson

J. Electron. Test., 2003

Effectiveness Improvement of ECR Tests.

Wanli Jiang, Eric Peterson, Bob Robotka

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Statistical threshold formulation for dynamic I_dd test.

Wanli Jiang, Bapiraju Vinnakota

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

2001

Defect-oriented test scheduling.

Wanli Jiang, Bapiraju Vinnakota

IEEE Trans. Very Large Scale Integr. Syst., 2001

Practical application of energy consumption ratio test.

Eric Peterson, Wanli Jiang

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

IC test using the energy consumption ratio.

Wanli Jiang, Bapiraju Vinnakota

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

1999

Statistical threshold formulation for dynamic I_dd test.

Wanli Jiang, Bapiraju Vinnakota

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Process-tolerant test with energy consumption ratio.

Bapiraju Vinnakota, Wanli Jiang, Dechang Sun

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Fast State Verification.

Dechang Sun, Bapiraju Vinnakota, Wanli Jiang

Proceedings of the 35th Conference on Design Automation, 1998