Wei Liu

Orcid: 0000-0003-0743-9967

Affiliations:
  • Zhejiang University, College of Electronic Engineering and Information Science, Hangzhou, China
  • Zhejiang University, International Joint Innovation Center, Haining, China


According to our database1, Wei Liu authored at least 4 papers between 2018 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2022
Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2018
Sub-1 ns characterization methodology for transistor electrical parameter extraction.
Microelectron. Reliab., 2018

Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018


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