Wei Liu
Orcid: 0000-0003-0743-9967Affiliations:
- Zhejiang University, College of Electronic Engineering and Information Science, Hangzhou, China
- Zhejiang University, International Joint Innovation Center, Haining, China
According to our database1,
Wei Liu
authored at least 4 papers
between 2018 and 2022.
Collaborative distances:
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Bibliography
2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2018
Sub-1 ns characterization methodology for transistor electrical parameter extraction.
Microelectron. Reliab., 2018
Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018