Junkang Li

According to our database1, Junkang Li authored at least 3 papers between 2017 and 2018.

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Bibliography

2018
Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Ge CMOS technology with advanced interface and junction engineering.
Proceedings of the 2018 International Conference on IC Design & Technology, 2018

2017
NiGe metal source/drain Ge pMOSFETs for future high performance VLSI circuits applications.
Proceedings of the 12th IEEE International Conference on ASIC, 2017


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