Junkang Li

Orcid: 0000-0001-6611-077X

According to our database1, Junkang Li authored at least 12 papers between 2017 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2023
DHHFL-MABAC approach based on distance measure and comprehensive weight for sewage treatment company selection.
Soft Comput., December, 2023

Opponent-model search in games with incomplete information.
Proceedings of the 17èmes Journées d'Intelligence Artificielle Fondamentale, 2023

Electrical Properties of Each Channels in Vertical Stacked Gate-All-Around Nanosheet s-Si pMOSFETs.
Proceedings of the International Conference on IC Design and Technology, 2023

Systematic Study on Predicting the Lifetime of Si pMOSFETs During NBTI Stress Based on Low-Frequency Noise.
Proceedings of the International Conference on IC Design and Technology, 2023

2022
A TM-Based Adaptive Learning Data-Model for Trajectory Tracking and Real-Time Control of a Class of Nonlinear Systems.
IEEE Trans. Circuits Syst. I Regul. Pap., 2022

Determination of Domain Wall Velocity and Nucleation Time by Switching Dynamics Studies of Ferroelectric Hafnium Zirconium Oxide.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

Generalisation of alpha-beta search for AND-OR graphs with partially ordered values.
Proceedings of the 16èmes Journées d'Intelligence Artificielle Fondamentale, 2022

2020
StarAI: Reducing incompleteness in the game of Bridge using PLP.
CoRR, 2020

In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018
Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Ge CMOS technology with advanced interface and junction engineering.
Proceedings of the 2018 International Conference on IC Design & Technology, 2018

2017
NiGe metal source/drain Ge pMOSFETs for future high performance VLSI circuits applications.
Proceedings of the 12th IEEE International Conference on ASIC, 2017


  Loading...