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X. Blasco

According to our database1, X. Blasco authored at least 4 papers between 2001 and 2005.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

On csauthors.net:

Bibliography

2005
Breakdown spots of ultra-thin (EOT<1.5nm) HfO<sub>2</sub>/SiO<sub>2</sub> stacks observed with enhanced - CAFM.
[BibTeX]
[DOI]
X. Blasco
,
Montserrat Nafría
,
Xavier Aymerich
,
J. Pétry
,
Wilfried Vandervorst
Microelectron. Reliab., 2005

2002
Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown SiO<sub>2</sub> Gate Oxide on MOS Structures.
[BibTeX]
[DOI]
X. Blasco
,
Montserrat Nafría
,
Xavier Aymerich
Microelectron. Reliab., 2002

2001
Local current fluctuations before and after breakdown of thin SiO<sub>2</sub> films observed with conductive atomic force microscope.
[BibTeX]
[DOI]
Marc Porti
,
X. Blasco
,
Montserrat Nafría
,
Xavier Aymerich
,
Alexander Olbrich
,
Bernd Ebersberger
Microelectron. Reliab., 2001

Characterising the surface roughness of AFM grown SiO<sub>2</sub> on Si.
[BibTeX]
[DOI]
Daniel Hill
,
X. Blasco
,
Marc Porti
,
Montserrat Nafría
,
Xavier Aymerich
Microelectron. Reliab., 2001


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