Wilfried Vandervorst

According to our database, Wilfried Vandervorst authored at least 5 papers between 1999 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Conductive filaments multiplicity as a variability factor in CBRAM.

Umberto Celano, Ludovic Goux, Attilio Belmonte, Karl Opsomer, Christophe Detavernier, Malgorzata Jurczak, Wilfried Vandervorst

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2008

Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors.

W. Polspoel, Wilfried Vandervorst, Lidia Aguilera, Marc Porti, Montserrat Nafría, Xavier Aymerich

Microelectron. Reliab., 2008

2005

On the data interpretation of the C-AFM measurements in the characterization of thin insulating layers.

J. Pétry, Wilfried Vandervorst, Luigi Pantisano, Robin Degraeve

Microelectron. Reliab., 2005

Breakdown spots of ultra-thin (EOT<1.5nm) HfO₂/SiO₂ stacks observed with enhanced - CAFM.

X. Blasco, Montserrat Nafría, Xavier Aymerich, J. Pétry, Wilfried Vandervorst

Microelectron. Reliab., 2005

1999

Cost-effective cleaning and high-quality thin gate oxides.

Marc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke

IBM J. Res. Dev., 1999