Xiangdong Xuan

According to our database, Xiangdong Xuan authored at least 4 papers between 2001 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2006

Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects.

Xiangdong Xuan, Adit D. Singh, Abhijit Chatterjee

J. Electron. Test., 2006

2004

Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits.

Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh

Proceedings of the 9th European Test Symposium, 2004

2003

IC Reliability Simulator ARET and Its Application in Design-for-Reliability.

Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh, Namsoo P. Kim, Mark T. Chisa

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

2001

Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects.

Xiangdong Xuan, Abhijit Chatterjee

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001