Xiaowu Cai

Orcid: 0000-0001-6855-776X

According to our database1, Xiaowu Cai authored at least 14 papers between 2013 and 2026.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2026
High-Speed Floating Voltage Level Shifter With Self-Locked Noise Immunity for High-Side Gate Driver.
IEEE Trans. Very Large Scale Integr. Syst., March, 2026

A buffer layer based hardening strategy for SEB mitigation in high-voltage MOSFETs for space applications.
Microelectron. J., 2026

TID-induced leakage-assisted degradation and failure mechanisms in cathode-short base-resistance-controlled thyristors.
Microelectron. J., 2026

2025
A 600-V half-bridge gate drive circuit with high-speed and high-noise-immunity level shifter.
Microelectron. J., 2025

2024
A nMOS-R Cross-Coupled Level Shifter With High dV/dt Noise Immunity for 600-V High-Voltage Gate Driver IC.
IEEE Trans. Very Large Scale Integr. Syst., November, 2024

A Novel Reliability-Enhanced Dual Over-Temperature Protection Circuit With Delayed Thermal Restart for Power ICs.
IEEE Trans. Circuits Syst. II Express Briefs, March, 2024

A precision current sensing circuit with chopper amplifier of symmetric topology.
Microelectron. J., 2024

A dual-mode buck converter with dynamic sawtooth voltage for wide input voltage range application.
IEICE Electron. Express, 2024

An integrated capacitor-less LDO with transient and stability enhancement.
IEICE Electron. Express, 2024

2023
An on-chip integrated current sensor with high precision and large current range for smart power ICs.
Microelectron. J., April, 2023

Novel SenseFET structure for VDMOS with adopting body reverse bias technique to adjust the reference current ratio.
Microelectron. J., April, 2023

A high reliability under-voltage lock out circuit for power driver IC.
Integr., 2023

A wide input range, external capacitor-less LDO with fast transient response.
IEICE Electron. Express, 2023

2013
Investigation of high voltage SCR-LDMOS ESD device for 150 V SOI BCD process.
Microelectron. Reliab., 2013


  Loading...