Xuanyi Huo
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Bibliography
2026
High-Speed Floating Voltage Level Shifter With Self-Locked Noise Immunity for High-Side Gate Driver.
IEEE Trans. Very Large Scale Integr. Syst., March, 2026
TID-induced leakage-assisted degradation and failure mechanisms in cathode-short base-resistance-controlled thyristors.
Microelectron. J., 2026