Xing Li

Orcid: 0000-0002-0794-3613

Affiliations:

Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China

According to our database¹, Xing Li authored at least 3 papers between 2023 and 2026.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

Timeline

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Book In proceedings Article PhD thesis Dataset Other

Bibliography

2026

Ultra-thin p-type entrance window with tunnel oxide passivation contact heterojunction for high-performance silicon drift detectors.

[BibT_eX]

[DOI]

Microelectron. J., 2026

2023

Effect of bias conditions on transient anode current for quasi-double-sided silicon drift detector with high energy resolution.

[BibT_eX]

[DOI]

Microelectron. J., 2023

The effect of silicon films impurity compensation on the performance of silicon drift detector.

[BibT_eX]

[DOI]

Microelectron. J., 2023

Xing Li

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Bibliography

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