Xingguo Xiong

According to our database, Xingguo Xiong authored at least 9 papers between 2005 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Integration of harvester trajectory and satellite imagery for large-scale winter wheat mapping using deep positive and unlabeled learning.

Xingguo Xiong, Jie Yang, Renhai Zhong, Jinwei Dong, Jingfeng Huang, K. C. Ting, Yibin Ying, Tao Lin

Comput. Electron. Agric., January, 2024

2022

Large-Scale Rice Mapping Using Multi-Task Spatiotemporal Deep Learning and Sentinel-1 SAR Time Series.

Zhixian Lin, Renhai Zhong, Xingguo Xiong, Changqiang Guo, Jinfan Xu, Yue Zhu, Jialu Xu, Yibin Ying, K. C. Ting, Jingfeng Huang, Tao Lin

Remote. Sens., 2022

2019

An Automatic Head Surface Temperature Extraction Method for Top-View Thermal Image with Individual Broiler.

Xingguo Xiong, Mingzhou Lu, Weizhong Yang, Guanghui Duan, Qingyan Yuan, Mingxia Shen, Tomas Norton, Daniel Berckmans

Sensors, 2019

2017

Optimization of the Power Flow in a Smart Home.

Linfeng Zhang, Xingguo Xiong

Proceedings of the Online Engineering & Internet of Things, 2017

2008

Material Fatigue and Reliability of MEMS Accelerometers.

Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone

Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008

Control Circuitry for Self-Repairable MEMS Accelerometers.

Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone

Proceedings of the Technological Developments in Education and Automation, 2008

2006

Reliability Analysis of Self-Repairable MEMS Accelerometer.

Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

2005

A dual-mode built-in self-test technique for capacitive MEMS devices.

Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone

IEEE Trans. Instrum. Meas., 2005

Design and Analysis of Self-Repairable MEMS Accelerometer.

Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005