Xingji Li

Orcid: 0000-0002-3319-4521

According to our database1, Xingji Li authored at least 6 papers between 2017 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2023
Effect of Precursor Defects in Oxide Layer on Ionizing Radiation Damage of Bipolar Junction Transistors.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
ElasTool: An automated toolkit for elastic constants calculation.
Comput. Phys. Commun., 2022

2018
The effect of ionization and displacement damage on minority carrier lifetime.
Microelectron. Reliab., 2018

Synergistic effects of NPN transistors caused by combined proton irradiations with different energies.
Microelectron. Reliab., 2018

Simulation study of single event effects in the SiC LDMOS with a step compound drift region.
Microelectron. Reliab., 2018

2017
Impact of Passivation Layers on Irradiation Response of PNP Transistors Under Different Dose Rates.
IEEE Access, 2017


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