Chaoming Liu

According to our database, Chaoming Liu authored at least 12 papers between 2017 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments.

Hui Xu, Chaoming Liu, Ruijun Ma, Tai Song, Zhengfeng Huang, Jun Wang, Xuewei Qin, Yu Xia

Microelectron. J., January, 2024

2023

LQNTL: Low-overhead quadruple-node-upset self-recovery latch based on triple-mode redundancy.

Hui Xu, Jing Zhou, Ruijun Ma, Huaguo Liang, Zhengfeng Huang, Chaoming Liu

Integr., 2023

SIFTER: A Task-specific Alignment Strategy for Enhancing Sentence Embeddings.

Chao Yu, Wenhao Zhu, Chaoming Liu, Xiaoyu Zhang, Qiuhong Zhai

CoRR, 2023

2022

Exploiting Syntactic Information to Boost the Fine-tuning of Pre-trained Models.

Chaoming Liu, Wenhao Zhu, Xiaoyu Zhang, Qiuhong Zhai

Proceedings of the 46th IEEE Annual Computers, Software, and Applications Conferenc, 2022

2021

Learning multimodal word representation with graph convolutional networks.

Wenhao Zhu, Shuang Liu, Chaoming Liu

Inf. Process. Manag., 2021

Design of a high-performance 12T SRAM cell for single event upset tolerance.

Chunhua Qi, Yanqing Zhang, Guoliang Ma, Chaoming Liu, Tianqi Wang, Liyi Xiao, Mingxue Huo, Guofu Zhai

Sci. China Inf. Sci., 2021

Incorporating Syntactic and Phonetic Information into Multimodal Word Embeddings Using Graph Convolutional Networks.

Wenhao Zhu, Shuang Liu, Chaoming Liu

Proceedings of the IEEE International Conference on Acoustics, 2021

2020

Learning Multimodal Word Representations by Explicitly Embedding Syntactic and Phonetic Information.

Wenhao Zhu, Shuang Liu, Chaoming Liu, Xiaoya Yin, Xiaping Xu

IEEE Access, 2020

2018

The effect of ionization and displacement damage on minority carrier lifetime.

Jianqun Yang, Xingji Li, Chaoming Liu, Daniel M. Fleetwood

Microelectron. Reliab., 2018

Synergistic effects of NPN transistors caused by combined proton irradiations with different energies.

Xingji Li, Jianqun Yang, Chaoming Liu, Gang Bai, Wenbo Luo, Pengwei Li

Microelectron. Reliab., 2018

Simulation study of single event effects in the SiC LDMOS with a step compound drift region.

Mengtian Bao, Ying Wang, Xingji Li, Chaoming Liu, Cheng-Hao Yu, Fei Cao

Microelectron. Reliab., 2018

2017

Impact of Passivation Layers on Irradiation Response of PNP Transistors Under Different Dose Rates.

Xingji Li, Lei Dong, Jianqun Yang, Chaoming Liu

IEEE Access, 2017