Y. T. Lin

According to our database1, Y. T. Lin authored at least 3 papers between 1997 and 2012.

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Bibliography

2012

Systematic defect screening in controlled experiments using volume diagnosis.
Proceedings of the 2012 IEEE International Test Conference, 2012

1997
Defect prediction for reactive ion etching using neural networks.
Proceedings of International Conference on Neural Networks (ICNN'97), 1997


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