Bruce Cory

According to our database, Bruce Cory authored at least 10 papers between 2003 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2013

Innovative practices session 9C: Yield improvement: Challenges and directions.

B. Seshadri, Bruce Cory, S. Mitra

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

2012

An Industrial Study of System-Level Test.

Sounil Biswas, Bruce Cory

IEEE Des. Test Comput., 2012

Systematic defect screening in controlled experiments using volume diagnosis.

B. Seshadri, P. Gupta, Y. T. Lin, Bruce Cory

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Foundry workflow for dynamic-EFA-based yield ramp.

Cathy Kardach, I. Kapilevich, Jeffrey A. Block, Ted R. Lundquist, Steven Kasapi, J. Liao, Yin S. Ng, Bruce Cory

Microelectron. Reliab., 2011

2010

Scan chain failure analysis using laser voltage imaging.

Joy Y. Liao, Steven Kasapi, Bruce Cory, Howard L. Marks, Yin S. Ng

Microelectron. Reliab., 2010

2006

The Role of ATPG Fault Diagnostics in Driving Physical Analysis.

Roger Nicholson, Cathy Kardach, Bruce Cory

Proceedings of the 2006 IEEE International Test Conference, 2006

OCI: Open Compression Interface.

Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Needs fabless yield ramp foundry partnership to be most successful.

Bruce Cory

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Overcoming Fault Test Coverage with Time-Resolved Emission (TRE) Probing.

Steven Kasapi, Bruce Cory

Microelectron. Reliab., 2004

2003

Speed Binning with Path Delay Test in 150-nm Technology.

Bruce Cory, Rohit Kapur, Bill Underwood

IEEE Des. Test Comput., 2003