Yo-Wei Chen

According to our database1, Yo-Wei Chen authored at least 2 papers between 2015 and 2017.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2017
Robust test pattern generation for hold-time faults in nanometer technologies.
Proceedings of the 2017 International Symposium on VLSI Design, Automation and Test, 2017

2015
Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits.
Proceedings of the 24th IEEE Asian Test Symposium, 2015


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