Yootak Jun

According to our database1, Yootak Jun authored at least 2 papers between 2024 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2025
A Study on the Origin of Dynamic Charge Loss of Next Generation DRAM Cell Array Transistor.
Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024
Effect of Back Gate on Word Line Disturb Immunity of a Vertical Channel DRAM Cell Array Transistor.
Proceedings of the IEEE International Reliability Physics Symposium, 2024


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