Yootak Jun
According to our database1,
Yootak Jun
authored at least 2 papers
between 2024 and 2025.
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Bibliography
2025
A Study on the Origin of Dynamic Charge Loss of Next Generation DRAM Cell Array Transistor.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2024
Effect of Back Gate on Word Line Disturb Immunity of a Vertical Channel DRAM Cell Array Transistor.
Proceedings of the IEEE International Reliability Physics Symposium, 2024