Yoshinao Harada

According to our database1, Yoshinao Harada authored at least 2 papers in 2001.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2001
Effects of the sputtering deposition process of metal gate electrode on the gate dielectric characteristics.
Microelectron. Reliab., 2001

Effects of base layer thickness on reliability of CVD Si<sub>3</sub>N<sub>4</sub> stack gate dielectrics.
Microelectron. Reliab., 2001


  Loading...