Yoshinori Takao

Orcid: 0000-0002-3468-8857

According to our database1, Yoshinori Takao authored at least 4 papers between 2012 and 2014.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2014
Random telegraph noise as a new measure of plasma-induced charging damage in MOSFETs.
Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014

A new aspect of plasma-induced physical damage in three-dimensional scaled structures - Sidewall damage by stochastic straggling and sputtering.
Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014

2013
Atomistic simulations of plasma process-induced Si substrate damage - Effects of substrate bias-power frequency.
Proceedings of 2013 International Conference on IC Design & Technology, 2013

2012
Optimization problems for plasma-induced damage - A concept for plasma-induced damage design.
Proceedings of the IEEE International Conference on IC Design & Technology, 2012


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