Young-Chan Oh

According to our database, Young-Chan Oh authored at least 2 papers between 2021 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods.

Dong-Hee Lee, Eun-Su Kim, Seung-Hyun Choi, Young-Mok Bae, Jong-Bum Park, Young-Chan Oh, Kwang-Jae Kim

Comput. Ind., November, 2023

2021

An oversampling method for wafer map defect pattern classification considering small and imbalanced data.

Eun-Su Kim, Seung-Hyun Choi, Dong-Hee Lee, Kwang-Jae Kim, Young-Mok Bae, Young-Chan Oh

Comput. Ind. Eng., 2021