Young-Mok Bae
Orcid: 0000-0002-0033-6642
According to our database1,
Young-Mok Bae authored at least 10 papers
between 2021 and 2026.
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Bibliography
2026
Sub-class discovery in semiconductor defect detection through clustering and few-shot learning.
Expert Syst. Appl., 2026
2025
Multiple Response Optimization Under Interval Preference Parameter: An Intuitionistic Fuzzy Desirability Function Method.
IEEE Trans. Reliab., December, 2025
Set Response Surface Methodology and its Application in Solving the Wrinkle and Crack Problem in the Auto Industry.
IEEE Trans. Reliab., June, 2025
Development of a suspiciousness measure with reduced redundancy for screening machine sets in serial-parallel multistage manufacturing processes.
Expert Syst. Appl., 2025
Phase I change-point detection for ordinal profiles with arbitrary design: A nonparametric method and its application to warranty claims analysis.
Comput. Ind. Eng., 2025
2024
Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin map.
Adv. Eng. Informatics, 2024
2023
Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods.
Comput. Ind., November, 2023
Detecting abnormal behavior of automatic test equipment using autoencoder with event log data.
Comput. Ind. Eng., September, 2023
2022
Approach to derive golden paths based on machine sequence patterns in multistage manufacturing process.
J. Intell. Manuf., 2022
2021
An oversampling method for wafer map defect pattern classification considering small and imbalanced data.
Comput. Ind. Eng., 2021