Young-Mok Bae

Orcid: 0000-0002-0033-6642

According to our database¹, Young-Mok Bae authored at least 4 papers between 2021 and 2023.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

Timeline

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Bibliography

2023

Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods.

[BibT_eX]

[DOI]

Comput. Ind., November, 2023

Detecting abnormal behavior of automatic test equipment using autoencoder with event log data.

[BibT_eX]

[DOI]

Comput. Ind. Eng., September, 2023

2022

Approach to derive golden paths based on machine sequence patterns in multistage manufacturing process.

[BibT_eX]

[DOI]

J. Intell. Manuf., 2022

2021

An oversampling method for wafer map defect pattern classification considering small and imbalanced data.

[BibT_eX]

[DOI]

Comput. Ind. Eng., 2021

Young-Mok Bae

Timeline

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On csauthors.net:

Bibliography

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