Yu Lei

Orcid: 0000-0003-4321-0385

Affiliations:
  • Chinese Academy of Sciences, Shanghai Institute of Micro-System and Information Technology, State Key Laboratory of Functional Materials for Informatics, China


According to our database1, Yu Lei authored at least 15 papers between 2015 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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Bibliography

2024
Auto-Configuration Write Scheme With Enhanced Reliability for 3-D Cross-Point PCM.
IEEE Trans. Circuits Syst. II Express Briefs, February, 2024

2023
A 1S1R Model with the Monte Carlo Function for Subthreshold Sensing Operation.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

2022
Silicon Modeling of Spiking Neurons With Diverse Dynamic Behaviors.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2021
An Ultra-Low Quiescent Current Resistor-Less Power on Reset Circuit.
IEEE Trans. Circuits Syst. II Express Briefs, 2021

2020
BIST-Based Fault Diagnosis for PCM With Enhanced Test Scheme and Fault-Free Region Finding Algorithm.
IEEE Trans. Very Large Scale Integr. Syst., 2020

A self-start circuit with asymmetric inductors reconfigurable technology for dual-output boost converter for energy harvesting.
IEICE Electron. Express, 2020

2V/3 Bias Scheme with Enhanced Dynamic Read Performances for 3-D Cross Point PCM.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

2019
Near-threshold SIDO DC-DC converter with a high-precision ZCD for phase change memory chip.
IEICE Electron. Express, 2019

2018
A Changing-Reference Parasitic-Matching Sensing Circuit for 3-D Vertical RRAM.
IEEE Trans. Very Large Scale Integr. Syst., 2018

A Single-Reference Parasitic-Matching Sensing Circuit for 3-D Cross Point PCM.
IEEE Trans. Circuits Syst. II Express Briefs, 2018

2017
Capacitor-less LDR based on flipped voltage follower with dual-feedback loops.
IEICE Electron. Express, 2017

Enhanced 3 × VDD-tolerant ESD clamp circuit with stacked configuration.
IEICE Electron. Express, 2017

A novel high performance 3×VDD-tolerant ESD detection circuit in advanced CMOS process.
IEICE Electron. Express, 2017

Enhanced read performance for phase change memory using a reference column.
IEICE Electron. Express, 2017

2015
A smart primary side current sensing strategy for single stage isolated PFC controller.
IEICE Electron. Express, 2015


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