Yueling Jenny Zeng

According to our database, Yueling Jenny Zeng authored at least 4 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat.

Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang

Proceedings of the IEEE International Test Conference, 2023

2022

Wafer Map Pattern Analytics Driven By Natural Language Queries.

Yueling Jenny Zeng, Min Jian Yang, Li-C. Wang

Proceedings of the IEEE International Test Conference in Asia, 2022

2021

MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification.

Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan

Proceedings of the IEEE International Test Conference, 2021

2020

Learning A Wafer Feature With One Training Sample.

Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa

Proceedings of the IEEE International Test Conference, 2020