Chuanhe Jay Shan

According to our database, Chuanhe Jay Shan authored at least 11 papers between 2016 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification.

Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan

Proceedings of the IEEE International Test Conference, 2021

2020

Learning A Wafer Feature With One Training Sample.

Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa

Proceedings of the IEEE International Test Conference, 2020

2019

Primitive Concept Identification In A Given Set Of Wafer Maps.

Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa

Proceedings of the International Symposium on VLSI Design, Automation and Test, 2019

Deploying A Machine Learning Solution As A Surrogate.

Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa

Proceedings of the IEEE International Test Conference, 2019

Wafer Plot Classification Using Neural Networks and Tensor Methods.

Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa

Proceedings of the IEEE International Test Conference in Asia, 2019

Facilitating Deployment Of A Wafer-Based Analytic Software Using Tensor Methods: Invited Paper.

Li-C. Wang, Chuanhe Jay Shan, Ahmed Wahba

Proceedings of the International Conference on Computer-Aided Design, 2019

2018

Discovering Interesting Plots in Production Yield Data Analytics.

Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa

CoRR, 2018

Concept Recognition in Production Yield Data Analytics.

Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa

Proceedings of the IEEE International Test Conference, 2018

2017

Some considerations on choosing an outlier method for automotive product lines.

Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg

Proceedings of the IEEE International Test Conference, 2017

Systematic defect detection methodology for volume diagnosis: A data mining perspective.

Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang

Proceedings of the IEEE International Test Conference, 2017

2016

Consistency in wafer based outlier screening.

Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli

Proceedings of the 34th IEEE VLSI Test Symposium, 2016