Nik Sumikawa

According to our database1, Nik Sumikawa authored at least 25 papers between 2011 and 2020.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2020
Learning A Wafer Feature With One Training Sample.
Proceedings of the IEEE International Test Conference, 2020

2019
Wafer Pattern Recognition Using Tucker Decomposition.
Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Primitive Concept Identification In A Given Set Of Wafer Maps.
Proceedings of the International Symposium on VLSI Design, Automation and Test, 2019

Deploying A Machine Learning Solution As A Surrogate.
Proceedings of the IEEE International Test Conference, 2019

Wafer Plot Classification Using Neural Networks and Tensor Methods.
Proceedings of the IEEE International Test Conference in Asia, 2019

2018
Discovering Interesting Plots in Production Yield Data Analytics.
CoRR, 2018

Concept Recognition in Production Yield Data Analytics.
Proceedings of the IEEE International Test Conference, 2018

2017
Learning the process for correlation analysis.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Some considerations on choosing an outlier method for automotive product lines.
Proceedings of the IEEE International Test Conference, 2017

Kernel based clustering for quality improvement and excursion detection.
Proceedings of the IEEE International Test Conference, 2017

2016
Consistency in wafer based outlier screening.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015
Generalization of an outlier model into a "global" perspective.
Proceedings of the 2015 IEEE International Test Conference, 2015

Mitigating "No trouble found" component returns.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Reliability/yield trade-off in mitigating "no trouble found" field returns.
Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

2014
Yield optimization using advanced statistical correlation methods.
Proceedings of the 2014 International Test Conference, 2014

Multivariate outlier modeling for capturing customer returns - How simple it can be.
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

2013
A pattern mining framework for inter-wafer abnormality analysis.
Proceedings of the 2013 IEEE International Test Conference, 2013

2012
Data mining based prediction paradigm and its applications in design automation.
Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, 2012

An experiment of burn-in time reduction based on parametric test analysis.
Proceedings of the 2012 IEEE International Test Conference, 2012

Screening customer returns with multivariate test analysis.
Proceedings of the 2012 IEEE International Test Conference, 2012

Functional test content optimization for peak-power validation - An experimental study.
Proceedings of the 2012 IEEE International Test Conference, 2012

Novel test detection to improve simulation efficiency - A commercial experiment.
Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

2011
Understanding customer returns from a test perspective.
Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Forward prediction based on wafer sort data - A case study.
Proceedings of the 2011 IEEE International Test Conference, 2011

Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits.
Proceedings of the Design, Automation and Test in Europe, 2011


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