Yuibi Gomi

Orcid: 0009-0005-6422-6425

According to our database¹, Yuibi Gomi authored at least 3 papers between 2023 and 2025.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

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PhD thesis

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Bibliography

2025

A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement.

[BibT_eX]

[DOI]

CoRR, April, 2025

ML-assisted SRAM Soft Error Rate Characterization: Opportunities and Challenges.

[BibT_eX]

[DOI]

Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025

2023

Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Yuibi Gomi

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