Yuqian Pan
Orcid: 0000-0002-6270-4957
According to our database1,
Yuqian Pan authored at least 8 papers
between 2018 and 2026.
Collaborative distances:
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Bibliography
2026
IEEE Des. Test, June, 2026
2023
ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction Techniques.
IEEE Trans. Computers, June, 2023
LightWarner: Predicting Failure of 3D NAND Flash Memory Using Reinforcement Learning.
IEEE Trans. Computers, March, 2023
2021
IEEE Access, 2021
2020
Process-variation Effects on 3D TLC Flash Reliability: Characterization and Mitigation Scheme.
Proceedings of the 20th IEEE International Conference on Software Quality, 2020
Proceedings of the 29th IEEE Asian Test Symposium, 2020
2019
Proceedings of the 32nd IEEE International System-on-Chip Conference, 2019
2018