Yuqian Pan

Orcid: 0000-0002-6270-4957

According to our database1, Yuqian Pan authored at least 8 papers between 2018 and 2026.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2026
Evaluating 3-D Flash Memory Retention Reliability Under Temperature Elevation.
IEEE Des. Test, June, 2026

2023
ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction Techniques.
IEEE Trans. Computers, June, 2023

LightWarner: Predicting Failure of 3D NAND Flash Memory Using Reinforcement Learning.
IEEE Trans. Computers, March, 2023

2021
A Cyber Security Evaluation Framework for In-Vehicle Electrical Control Units.
IEEE Access, 2021

2020
Process-variation Effects on 3D TLC Flash Reliability: Characterization and Mitigation Scheme.
Proceedings of the 20th IEEE International Conference on Software Quality, 2020

Unexpected Error Explosion in NAND Flash Memory: Observations and Prediction Scheme.
Proceedings of the 29th IEEE Asian Test Symposium, 2020

2019
A NAND Flash Endurance Prediction Scheme with FPGA-based Memory Controller System.
Proceedings of the 32nd IEEE International System-on-Chip Conference, 2019

2018
The Setting and Optimization of Quick Queue.
J. Optim. Theory Appl., 2018


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