Haichun Zhang

According to our database, Haichun Zhang authored at least 12 papers between 2019 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction Techniques.

Yuqian Pan, Zhaojun Lu, Haichun Zhang, Haoming Zhang, Md Tanvir Arafin, Zhenglin Liu, Gang Qu

IEEE Trans. Computers, June, 2023

LightWarner: Predicting Failure of 3D NAND Flash Memory Using Reinforcement Learning.

Yuqian Pan, Haichun Zhang, Runze Yu, Zhaojun Lu, Haoming Zhang, Zhenglin Liu

IEEE Trans. Computers, March, 2023

2022

Fooling the Eyes of Autonomous Vehicles: Robust Physical Adversarial Examples Against Traffic Sign Recognition Systems.

Wei Jia, Zhaojun Lu, Haichun Zhang, Zhenglin Liu, Jie Wang, Gang Qu

Proceedings of the 29th Annual Network and Distributed System Security Symposium, 2022

2021

Corrigendum to "Design and implementation of robust and low-cost SRAM PUF using PMOS and linear shift register extractor" [Microelectron. J. 103C (2020) 104844].

Mingyang Gong, Haichun Zhang, Chao Wang, Qiaoling Tong, Zhenglin Liu

Microelectron. J., 2021

A Cyber Security Evaluation Framework for In-Vehicle Electrical Control Units.

Haichun Zhang, Yuqian Pan, Zhaojun Lu, Jie Wang, Zhenglin Liu

IEEE Access, 2021

2020

CANsec: A Practical in-Vehicle Controller Area Network Security Evaluation Tool.

Haichun Zhang, Xu Meng, Xiong Zhang, Zhenglin Liu

Sensors, 2020

An Improved Design and Implementation of a Range-Controlled Communication System for Mobile Phones.

Mingyang Gong, Haichun Zhang, Zhenglin Liu

Sensors, 2020

Design and implementation of robust and low-cost SRAM PUF using PMOS and linear shift register extractor.

Mingyang Gong, Haichun Zhang, Chao Wang, Qiaoling Tong, Zhenglin Liu

Microelectron. J., 2020

Process-variation Effects on 3D TLC Flash Reliability: Characterization and Mitigation Scheme.

Yuqian Pan, Haichun Zhang, Mingyang Gong, Zhenglin Liu

Proceedings of the 20th IEEE International Conference on Software Quality, 2020

Unexpected Error Explosion in NAND Flash Memory: Observations and Prediction Scheme.

Yuqian Pan, Haichun Zhang, Mingyang Gong, Zhenglin Liu

Proceedings of the 29th IEEE Asian Test Symposium, 2020

2019

A Blockchain-Based Privacy-Preserving Authentication Scheme for VANETs.

Zhaojun Lu, Qian Wang, Gang Qu, Haichun Zhang, Zhenglin Liu

IEEE Trans. Very Large Scale Integr. Syst., 2019

A NAND Flash Endurance Prediction Scheme with FPGA-based Memory Controller System.

Zhuo Chen, Yuqian Pan, Mingyang Gong, Haichun Zhang, Mingyu Zhang, Zhenglin Liu

Proceedings of the 32nd IEEE International System-on-Chip Conference, 2019