Yutai Su
Orcid: 0000-0001-7756-2560
According to our database1,
Yutai Su
authored at least 4 papers
between 2017 and 2021.
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Bibliography
2021
IEEE Trans. Instrum. Meas., 2021
2020
Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle.
IEEE Access, 2020
2018
Microelectron. Reliab., 2018
2017
Proceedings of the IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29, 2017