Zhelong Piao
Orcid: 0000-0001-5456-5881
According to our database1,
Zhelong Piao
authored at least 2 papers
between 2022 and 2023.
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Bibliography
2023
Edge Word-Line Reliability Problem in 3-D NAND Flash Memory: Observations, Analysis, and Solutions.
IEEE Trans. Very Large Scale Integr. Syst., June, 2023
2022
TCSE: A Target Cell States Elimination Coding Strategy for Highly Reliable Data Storage Based on 3-D nand Flash Memory.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022