A. Dehbi

According to our database, A. Dehbi authored at least 4 papers between 2002 and 2006.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2006

Defect detection in multilayer ceramic capacitors.

V. Krieger, Wolfgang Wondrak, A. Dehbi, W. Bartel, Yves Ousten, Bruno Levrier

Microelectron. Reliab., 2006

2005

Failure mechanisms and qualification testing of passive components.

H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Yves Ousten, G. Lekens, A. Dehbi

Microelectron. Reliab., 2005

Vibration lifetime modelling of PCB assemblies using steinberg model.

A. Dehbi, Yves Ousten, Yves Danto, Wolfgang Wondrak

Microelectron. Reliab., 2005

2002

High temperature reliability testing of aluminum and tantalum electrolytic capacitors.

A. Dehbi, Wolfgang Wondrak, Yves Ousten, Yves Danto

Microelectron. Reliab., 2002