Yves Danto

According to our database, Yves Danto authored at least 26 papers between 1997 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

Dynamic void formation in a DD-copper-structure with different metallization geometry.

Kirsten Weide-Zaage, David Dalleau, Yves Danto, Hélène Frémont

Microelectron. Reliab., 2007

Torsion test applied for reballing and solder paste volume evaluation.

W. C. Maia Filho, M. Brizoux, Hélène Frémont, Yves Danto

Microelectron. Reliab., 2007

2006

Improved physical understanding of intermittent failure in continuous monitoring method.

W. C. Maia Filho, M. Brizoux, Hélène Frémont, Yves Danto

Microelectron. Reliab., 2006

Multi-level Modeling of Hot Carrier Injection for Reliability.

Corinne Bestory, François Marc, Hervé Levi, Yves Danto

Proceedings of the Forum on specification and Design Languages, 2006

2005

Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier.

S. Huyghe, Laurent Béchou, Nicolas Zerounian, Yannick Deshayes, Frédéric Aniel, A. Denolle, Dominique Laffitte, Jean-Luc Goudard, Yves Danto

Microelectron. Reliab., 2005

Vibration lifetime modelling of PCB assemblies using steinberg model.

A. Dehbi, Yves Ousten, Yves Danto, Wolfgang Wondrak

Microelectron. Reliab., 2005

2004

Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests.

Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé

Microelectron. Reliab., 2004

How to study delamination in plastic encapsulated devices.

Hélène Frémont, Jean-Yves Delétage, Kirsten Weide-Zaage, Yves Danto

Microelectron. Reliab., 2004

Reliability of Low-Cost PCB Interconnections for Telecommunication Applications.

Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto

Microelectron. Reliab., 2004

2003

An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy.

Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano

IEEE Trans. Instrum. Meas., 2003

Moisture diffusion in BCB resins used for MEMS packaging.

Angie Tetelin, Claude Pellet, Jean-Yves Delétage, B. Carbonne, Yves Danto

Microelectron. Reliab., 2003

Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study.

B. Mongellaz, François Marc, Yves Danto

Microelectron. Reliab., 2003

Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.

Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard

Microelectron. Reliab., 2003

Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.

Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard

Microelectron. Reliab., 2003

Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.

Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto

Microelectron. Reliab., 2003

Simulation of time depending void formation in copper, aluminum and tungsten plugged via structures.

David Dalleau, Kirsten Weide-Zaage, Yves Danto

Microelectron. Reliab., 2003

A physical approach on SCOBIC investigation in VLSI.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto

Microelectron. Reliab., 2003

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.

G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys

Microelectron. Reliab., 2003

Reliability simulation of electronic circuits with VHDL-AMS.

François Marc, B. Mongellaz, Yves Danto

Proceedings of the Forum on specification and Design Languages, 2003

2002

Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions.

B. Trégon, Yves Ousten, Yves Danto, Laurent Béchou, Bernard Parmentier

Microelectron. Reliab., 2002

Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language.

B. Mongellaz, François Marc, N. Milet-Lewis, Yves Danto

Microelectron. Reliab., 2002

Evaluation of a micropackaging analysis technique by highfrequency microwaves.

Geneviève Duchamp, Yves Ousten, Yves Danto

Microelectron. Reliab., 2002

High temperature reliability testing of aluminum and tantalum electrolytic capacitors.

A. Dehbi, Wolfgang Wondrak, Yves Ousten, Yves Danto

Microelectron. Reliab., 2002

Acoustic analysis of an assembly: Structural identification by signal processing (wavelets).

Jean Augereau, Yves Ousten, Laurent Béchou, Yves Danto

Microelectron. Reliab., 2002

Behavioral Modeling of Analogue and Mixed Integrated Systems with VHDL-AMS for RF Applications.

Ahmed Fakhfakh, Hervé Levi, N. Milet-Lewis, Yves Danto

Proceedings of the 15th Annual Symposium on Integrated Circuits and Systems Design, 2002

1997

A World-Wide-Web based instrumentation pool real testing in a virtual world.

Thomas Zimmer, Patrice Kadionik, Yves Danto

Proceedings of the 1997 IEEE International Conference on Microelectronic Systems Education, 1997