G. Lekens

According to our database, G. Lekens authored at least 3 papers between 2003 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2007

Lifetime modeling of intrinsic gate oxide breakdown at high temperature.

R. Moonen, Piet Vanmeerbeek, G. Lekens, Ward De Ceuninck, Peter Moens, J. Boutsen

Microelectron. Reliab., 2007

2005

Failure mechanisms and qualification testing of passive components.

H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Yves Ousten, G. Lekens, A. Dehbi

Microelectron. Reliab., 2005

2003

Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.

Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne

Microelectron. Reliab., 2003