A. Knauer

According to our database1, A. Knauer authored at least 2 papers between 2011 and 2016.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2016
Normally-off GaN-HEMTs with p-type gate: Off-state degradation, forward gate stress and ESD failure.
Microelectron. Reliab., 2016

2011
Reliability issues of GaN based high voltage power devices.
Microelectron. Reliab., 2011


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