A. Sebastiani

According to our database¹, A. Sebastiani authored at least 3 papers between 2005 and 2009.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

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Bibliography

2009

Trapped charge and stress induced leakage current (SILC) in tunnel SiO<sub>2</sub> layers of de-processed MOS non-volatile memory devices observed at the nanoscale.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2009

2007

High-K dielectrics for inter-poly application in non volatile memories.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2007

2005

Tunnel oxide degradation under pulsed stress.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2005

A. Sebastiani

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