G. Giusto

According to our database1, G. Giusto authored at least 3 papers between 2003 and 2005.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2005
Impact of interface and bulk trapped charges on transistor reliability.
Microelectron. Reliab., 2005

Tunnel oxide degradation under pulsed stress.
Microelectron. Reliab., 2005

2003
Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET.
Microelectron. Reliab., 2003


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