Abhishek Singh

According to our database, Abhishek Singh authored at least 11 papers between 2001 and 2006.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2006

Defect Simulation Methodology for i_DDT Testing.

Abhishek Singh, Jim Plusquellic, Dhananjay S. Phatak, Chintan Patel

J. Electron. Test., 2006

Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method.

Jim Plusquellic, Dhruva Acharyya, Abhishek Singh, Mohammad Tehranipoor, Chintan Patel

IEEE Des. Test Comput., 2006

2005

Defect Detection Using Quiescent Signal Analysis.

Chintan Patel, Abhishek Singh, Jim Plusquellic

J. Electron. Test., 2005

2004

Fault Simulation Model for i{DDT} Testing: An Investigation.

Abhishek Singh, Chintan Patel, Jim Plusquellic

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

On-Chip Impulse Response Generation for Analog and Mixed-Signal Testing.

Abhishek Singh, Chintan Patel, Jim Plusquellic

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Defect detection under Realistic Leakage Models using Multiple IDDQ Measurement.

Chintan Patel, Abhishek Singh, Jim Plusquellic

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Power supply transient signal analysis for defect-oriented test.

James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003

Path Delay Estimation using Power Supply Transient Signals: A Comparative Study using Fourier and Wavelet Analysis.

Abhishek Singh, Jitin Tharian, Jim Plusquellic

Proceedings of the 2003 International Conference on Computer-Aided Design, 2003

Comparison of Branching CORDIC Implementations.

Abhishek Singh, Dhananjay S. Phatak, Tom Goff, Mike Riggs, James F. Plusquellic, Chintan Patel

Proceedings of the 14th IEEE International Conference on Application-Specific Systems, 2003

2002

Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models.

Abhishek Singh, Jim Plusquellic, Anne E. Gattiker

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2001

Detecting delay faults using power supply transient signal analysis.

Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001