Afef Kchaou

Orcid: 0009-0004-0300-3028

According to our database1, Afef Kchaou authored at least 5 papers between 2016 and 2026.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2026
Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability.
Inf., 2026

2025
Reliability of LEON3 Processor's Program Counter Against SEU, MBU, and SET Fault Injection.
Cryptogr., 2025

2021
An In-Depth Vulnerability Analysis of RISC-V Micro-Architecture Against Fault Injection Attack.
Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

2018
Performance Analysis of a Multicore Based LEON3 Integrating a RTOS.
Proceedings of the 15th International Multi-Conference on Systems, Signals & Devices, 2018

2016
A deep analysis of SEU consequences in the internal memory of LEON3 processor.
Proceedings of the 17th Latin-American Test Symposium, 2016


  Loading...