Akira Taketani

According to our database, Akira Taketani authored at least 3 papers between 2010 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Test Pattern Ordering and Selection for High Quality Test Set under Constraints.

Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hideo Fujiwara

IEICE Trans. Inf. Syst., 2012

2010

Test pattern selection to optimize delay test quality with a limited size of test set.

Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hiroshi Iwata, Hideo Fujiwara

Proceedings of the 15th European Test Symposium, 2010

Seed Ordering and Selection for High Quality Delay Test.

Tomokazu Yoneda, Michiko Inoue, Akira Taketani, Hideo Fujiwara

Proceedings of the 19th IEEE Asian Test Symposium, 2010