Alexej Dmitriev

According to our database, Alexej Dmitriev authored at least 9 papers between 1996 and 2003.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2003

Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output.

Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel

IEEE Trans. Computers, 2003

2002

Synthesis of single-output space compactors for scan-based sequential circuits.

Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

Robust Space Compaction of Test Responses.

Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty

Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

2001

Synthesis of single-output space compactors with application to scan-based IP cores.

Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty

Proceedings of ASP-DAC 2001, 2001

2000

New Self-dual Circuits for Error Detection and Testing.

Alexej Dmitriev, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel, V. Moshanin, Andrej A. Morosov

VLSI Design, 2000

Zero-Aliasing Space Compression using a Single Periodic Output and its Application to Testing of Embedded Cores.

Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel

Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000

A New Method for Concurrent Checking by Use of a 1-out-of-4 Code.

Michael Gössel, Alexej Dmitriev, Vladimir V. Saposhnikov, Valerij V. Saposhnikov

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

1998

Self-Dual Duplication for Error Detection.

Vladimir V. Saposhnikov, Valerij V. Saposhnikov, Alexej Dmitriev, Michael Gössel

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1996

Self-dual parity checking-A new method for on-line testing.

Vladimir V. Saposhnikov, Alexej Dmitriev, Michael Gössel, Valerij V. Saposhnikov

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996