Antonio H. Chan

According to our database1, Antonio H. Chan authored at least 4 papers between 2001 and 2004.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2004
A jitter characterization system using a component-invariant Vernier delay line.
IEEE Trans. Very Large Scale Integr. Syst., 2004

A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2002
A deep sub-micron timing measurement circuit using a single-stage Vernier delay line.
Proceedings of the IEEE 2002 Custom Integrated Circuits Conference, 2002

2001
A synthesizable, fast and high-resolution timing measurement device using a component-invariant vernier delay line.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001


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