Mohamed M. Hafed

According to our database, Mohamed M. Hafed authored at least 10 papers between 2000 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2004

A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing.

Mohamed M. Hafed, Antonio H. Chan, Geoffrey D. Duerden, Bardia Pishdad, Clarence Tam, Sébastien Laberge, Gordon W. Roberts

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Techniques for high-frequency integrated test and measurement.

Mohamed M. Hafed, Gordon W. Roberts

IEEE Trans. Instrum. Meas., 2003

An 8-channel, 12-bit, 20 MHz fully differential tester IC for analog and mixed-signal circuits.

Mohamed M. Hafed, Gordon W. Roberts

Proceedings of the ESSCIRC 2003, 2003

A 5-channel, variable resolution, 10-GHz sampling rate coherent tester/oscilloscope IC and associated test vehicles.

Mohamed M. Hafed, Gordon W. Roberts

Proceedings of the IEEE Custom Integrated Circuits Conference, 2003

2002

A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits.

Mohamed M. Hafed, Nazmy Abaskharoun, Gordon W. Roberts

IEEE J. Solid State Circuits, 2002

Test and Evaluation of Multiple Embedded Mixed-Signal Test Cores.

Mohamed M. Hafed, Gordon W. Roberts

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Strategies for on-chip sub-nanosecond signal capture and timing measurements.

Nazmy Abaskharoun, Mohamed M. Hafed, Gordon W. Roberts

Proceedings of the 2001 International Symposium on Circuits and Systems, 2001

2000

A stand-alone integrated test core for time and frequency domain measurements.

Mohamed M. Hafed, Nazmy Abaskharoun, Gordon W. Roberts

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

A robust deep submicron programmable DC voltage generator.

Mohamed M. Hafed, Sébastien Laberge, Gordon W. Roberts

Proceedings of the IEEE International Symposium on Circuits and Systems, 2000

A stand-alone integrated excitation/extraction system for analog BIST applications.

Mohamed M. Hafed, Gordon W. Roberts

Proceedings of the IEEE 2000 Custom Integrated Circuits Conference, 2000